The ferromagnet/antiferromagnet (FM/AF) exchange bias effect was first discovered by Meiklejohn and Bean in a system of partially oxidized particles. The study of exchange bias in nanostructures has attracted considerable recent attention for its unique properties due to the reduction of the lateral dimensions. Various methods have been developed to fabricate exchange biased nanostructures using advanced lithography techniques. In contrast, simple and inexpensive non-lithographic methods are highly advantageous.