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A major challenge in the development of novel devices in nano-and molecular electronics is their interconnection with larger scale electrical circuits required to control and characterize their functional properties.Local electrical probing by multiple probes with STM precision can significantly improve efficiency in analyzing individual nano-electronic devices without the need of a full electrical integration.Recently we developed a new microscope stage that merges the requirements of a SEM navigated 4-probe STM and at the same time satisfy the needs for high performance SPM at low temperatures.