【摘 要】
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In order to measure the optical constants of VO2 thin films,a whole optical spectrum fitting method is proposed in this paper.Firstly we use the admittance
【机 构】
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ElectronicEngineeringInstituteChina
【出 处】
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2016年第二届光子学与光学工程国际会议暨第八届西部光子学会议
论文部分内容阅读
In order to measure the optical constants of VO2 thin films,a whole optical spectrum fitting method is proposed in this paper.Firstly we use the admittance matrix method to derive the function of the transmittance "T",the film thickness "D",refraction rate "n" and extinction coefficient "K".Secondly,the simplex method is used to optimize this function.Finally,we use MATLAB programming method for whole optical spectrum fitting of infrared transmittance of VO2 thin films at low temperature state and high temperature state.Then the fitting curves of the optical constants of VO2 thin films,such as refractive index and extinction coefficient,are obtained.The results show that the fitting curves are in agreement with the existing research results and the measured curves.The optical constants obtained by the whole spectrum fitting method can be used to describe the VO2 thin films accurately,providing the basis for the optimum design of film thickness.Furthermore,in order to describe the optical constants of VO2 thin films more easily,the Cauchy dispersion model equation is also introduced in this paper to fit the optical constants of mid far infrared wave band(2.5~15μm)which was obtained by the whole spectrum fitting method.
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