In this paper,a high resolution tilt measurement system has been proposed and demonstrated using multi MEMS (Micro-electromechanical Systems) accelerometers.The measurement system is mainly composed of MEMS accelerometers as sensing unit,a MCU (Micro Controller Unit),wireless transceivers,battery and a PC terminal.Three MEMS accelerometers are purposely located with specific orientations and the system output is determined from the accelerometer that is most sensitive in the tilting range of the object under testing.The raw measured signal collected by the MCU is processed using Kalman Filter (KF) and the analysed data is transmitted to the PC terminal by a wireless module.The effect of different KF parameters are analysed using the Allan variance.Static and dynamic tests are performed.After eliminating the accelerometers’ installation errors,the measuring resolution of system is found to be 0.02° in the whole range from 0° to 360°.The minimum resolution is found to be 0.03° by the tilt sensor under the random excitation with a peak value is 0.8g and the vibration frequency is 25Hz.In the step test of tilting back and forth,it is found that the absolute measurement error is less than 0.004° for the step change of 0.05°.