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Quality improvement of ZnO films and UV detectors based on them
【作 者】
:
【机 构】
:
Frantsevich Institute for Problems of Material Science,NASU,Kyiv,03680,Ukraine
【出 处】
:
第六届国际氧化锌及相关材料研讨会
【发表日期】
:
2010年4期
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