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The electrical properties of the layer semiconductors including MoS and WS grown by chemical vapor transport method(CVT)have been investigated.
Thickness-Dependent Transport Properties And Ohmic Contacts In MoS And WS Layer Nanostructures
【摘 要】
：
The electrical properties of the layer semiconductors including MoS and WS grown by chemical vapor transport method(CVT)have been investigated.
【出 处】
：
2015台湾物理年会
【发表日期】
：
2015年期
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