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Inverse problems convert indirect measurements into useful characterizations of the parameters of a physical system.
Advances in MCMC and related sampling methods for large-scale inverse problems
【摘 要】
：
Inverse problems convert indirect measurements into useful characterizations of the parameters of a physical system.
【机 构】
：
The Univ.of Texas at Austin
【出 处】
：
第八届工业与应用数学国际大会
【发表日期】
：
2015年期
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