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5. Dynamic crystal rotation resolved by high-speed synchrotron x-ray Laue diffraction

Dynamic crystal rotation resolved by high-speed synchrotron x-ray Laue diffraction

来源 :第26届国际高压科学技术大会、第8届亚洲高压科技学术会议暨第19届中国高压科学技术会议(The 26th Interna | 被引量 : 0次 | 上传用户：zy657592895zy

【摘 要】

：

Dynamic compression experiments are performed on single-crystal Si under split Hopkinson pressure bar loading,together with simultaneous,high-speed(250-350 ns resolution),synchrotron x-ray Laue diffra

【作 者】

：

J.W. Huang S.N. Luo 

【机 构】

：

The Peac Institute of Multiscale Sciences,Chengdu,610031,People's Republic of China

【出 处】

：

第26届国际高压科学技术大会、第8届亚洲高压科技学术会议暨第19届中国高压科学技术会议(The 26th Interna

【发表日期】

：

2017年10期

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　　Dynamic compression experiments are performed on single-crystal Si under split Hopkinson pressure bar loading,together with simultaneous,high-speed(250-350 ns resolution),synchrotron x-ray Laue diffraction and phase-contrast imaging.

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