As the electronic devices developed,the control of electromagnetic (EM) wave for specific properties (propagation guide,shielding,etc.) has become important in many applications,such as EM interference test.Conducting material design is an easy way to realize planar scattering structure,however,it has high sensitivity on surface configuration in microwave ranges.This study proposes the planar scattering structure in the C-band consisting of dielectric materials as an alternative to conventional structures.