Reliability Tests and Improvements on Sc-contacted n-type Carbon Reliability Tests and Improvements

来源 :中国物理学会2013年秋季学术会议 | 被引量 : 0次 | 上传用户:tintin123456
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  Scandium (Sc) contacted n-type carbon nanotube (CNT) field-effected transistors (FETs) with back and top-gate structure were fabricated,and their stability in air were investigated.It was shown that oxygen and water molecules may affect both the nanotube channel and Sc/nanotube contacts,leading to deteriorated contact quality and device performance.
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