Detection for Young's Modulus of Microcantilevers in Atomic Force Microscopy

来源 :International Conference on Experimental Mechanics 2008(ICEM | 被引量 : 0次 | 上传用户：UserReg

【作者】

：

Fei Wang Xuezeng Zhao

【机构】

：

School of Mechanical and Electronic Engineering, Harbin Institute of Technology, Harbin, China

【出处】

：

International Conference on Experimental Mechanics 2008(ICEM

【发表日期】

：

2008年1期

【关键词】

：

atomic force microscopy micro cantilevers young's modulus frequency measure

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Detection for Young's Modulus of Microcantilevers in Atomic Force Microscopy

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