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用４ 种不同阈能的活化箔测量和比较了两种铍系统中的绝对活化反应率。铍厚分别为５．３ 和８．４ ｃｍ ，活化箔为Ｉｎ、Ｚｎ、Ａｌ和Ｃｕ。实验总误差为５ ％ ～７ ％ 。分析和比较了实验结果与用１－ＤＡＮＩＳＮ 程序和ＥＮＤＦ／Ｂ－Ⅵ库数据的计算结果，两者间的偏差均小于７ ％ 。
The activation activation rates in two beryllium systems were measured and compared using four different threshold activated foil grades. The beryllium thicknesses were 5.3 and 8.4 cm respectively, and the activated foils were In, Zn, Al and Cu. The total experimental error is 5% ~ 7%. The experimental results and the calculation results of 1-DANISN program and ENDF / B-Ⅵ database were analyzed and compared. The deviation between them was less than 7%.