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该文采用溶剂热合成方法,制备Al(OH)(1,4-NDC)·2H_2O粉末样品及其在Si、Au/Si、COOH-Au/Si基底上的薄膜,并通过X射线广角衍射法检测其在基底表面上的取向生长,发现在Si和Au/Si基底上的Al(OH)(1,4-NDC)·2H_2O配位聚合物沿着[100]的方向生长。实验表明,通过增加反应时间(24~72 h),基底上的晶体不断增大,衍射特征峰也不断增强,说明延长反应时间有利于Al(OH)(1,4-NDC)·2H_2O薄膜的取向生长,这为配位聚合物在硅及其改性基底表面上制备有取向的MOFs薄膜提供了理论依据。
In this paper, Al (OH) (1,4-NDC) · 2H_2O powder samples and their films on Si, Au / Si and COOH-Au / Si substrates were prepared by the solvothermal synthesis method and characterized by X-ray wide angle diffraction The orientation growth of Al (OH) (1,4-NDC) · 2H_2O coordination complex on Si and Au / Si substrates was observed in the direction of [100]. Experiments show that by increasing the reaction time (24 ~ 72 h), the crystals on the substrate are increasing and the diffraction peaks are also increasing, which indicates that prolonging the reaction time is favorable for the growth of Al (OH) (1,4-NDC) · 2H_2O films Oriented growth, which provides a theoretical basis for coordination polymer in the preparation of oriented MOFs films on silicon and its modified substrate surface.