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开展了在伪装网基布上镀In2O3/SnO2薄膜的性能研究,系统分析了薄膜厚度对其光谱反射性能的影响;总结了薄膜厚度对In2O3/SnO2薄膜表面形貌、光谱反射辐射性能的影响规律,为In2O3/SnO2薄膜的红外伪装应用奠定了基础理论和实验依据.
The properties of In2O3 / SnO2 thin films on camouflage mesh substrates were investigated. The influence of film thickness on the spectral reflectance properties was systematically analyzed. The influence of film thickness on the surface topography and spectral reflectance of In2O3 / SnO2 thin films was summarized , Which laid the basic theory and experimental basis for the infrared camouflage application of In2O3 / SnO2 thin films.