特征X射线强度与入射电子能量的关系式在X射线衍射、X射线荧光分析及电子探针的实验中都是重要的参数。在不同的X射线管压管流条件下测定并比较衍射强度时或在X射线荧光及电子探针的定量工作中都需要利用这一关系式。我们在实验工作中发现,目前文献资料中普遍引用的这类理论计算或实验测定的关系式与实际情况不太吻合。本文用X射线 The relationship between the characteristic X-ray intensity and incident electron energy is an important parameter in the experiments of X-ray diffraction, X-ray fluorescence analysis and electron probe. This relationship needs to be used when determining and comparing diffraction intensities under different X-ray tube flow conditions or both in X-ray fluorescence and electron probe quantitation. We found in the experimental work, the current literature reference commonly used in such theoretical calculations or experimental determination of the relationship between the actual situation is not consistent. This article uses X-rays