论文部分内容阅读
在空间辐射环境下,SRAM型FPGA比ASIC器件更容易产生单粒子翻转(SEU)效应,造成器件逻辑错误和系统故障,因此对航天应用中的SRAM型FPGA必须采取相应的抗单粒子翻转设计措施,提高FPGA空间应用的可靠性。分析了SEU产生原因及国内外针对SEU效应提出的FPGA加固设计方法,重点分析介绍了三模冗余技术、刷新回读技术和局部动态可重构技术等加固技术,总结比较了各种技术的优缺点。
In space radiation environment, SRAM-type FPGAs are more likely to cause single-event-on-flip (SEU) effects than ASIC devices, resulting in device logic errors and system failures, and therefore, SRAM-type FPGAs for aerospace applications must be designed to counter single- , Improve the reliability of FPGA space applications. The causes of SEU and the design method of FPGA reinforcement based on the SEU effect both at home and abroad are analyzed. The emphasis is put on the reinforcement technologies of three-mode redundancy, refresh readback and local dynamic reconfigurable technologies. The advantages and disadvantages of various technologies Advantages and disadvantages.