应用计算机微观图像采集分析系统建立了一套对超细材料进行形状表征和粒度测量的方法。该方法克服以往图像法测量样本小 ,得不到正确粒度分布的弊端。通过对SiO2 标准物的粒度测定表明 :均匀、单分散的测量样片的制备是图像法准确测量和分析的关键。当测量图片在 6张以上 ,累积测量颗粒总数在 2 0 0个左右时 ,测量结果具有代表性。该系统用于测量的粒度范围为 0 .5 μm～ 1cm的粒子时 ,长度测量误差小于 5 % ,颗粒等面积直径测量偏差小于12 %。 A set of methods for shape characterization and particle size measurement of ultrafine materials was established by using computer micro image acquisition and analysis system. The method overcomes the shortcomings of the traditional image method to measure the sample size and can not obtain the correct particle size distribution. Through the SiO2 standard particle size determination shows that: uniform, monodisperse measurement of the preparation of the sample image accurate measurement and analysis of the key. The measurement results are representative when the number of measurement images is more than 6 and the cumulative total number of particles is about 200. When the system is used to measure particles with a size range of 0.5μm ~ 1cm, the measurement error of the length is less than 5% and the deviation of the measurement of the particle area is less than 12%.