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英国Verwon计量系统公司开发出一种新型影标式测微系统(IMS),用它测量结构复杂的二维工程组件精度可达到五千分之一,相当于测直径为100mm的元件可精确到20μm。这种非接触型装置是通过在数字式功率帧接收器中运用复杂的算法实现高精度的。
Verwon Metrology Systems of the United Kingdom has developed a new IMS that measures the accuracy of a two-dimensional structural component with a complex structure up to 1/5000, equivalent to measuring an element of 100mm diameter 20 μm. This non-contact device achieves high accuracy by using sophisticated algorithms in digital power frame receivers.