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A new probabilistic testability measure is presented to ease test length analyses of random testingand pseudorandom testing.The testability measure given in this paper is oriented to signal conflict ofreconvergent fanouts.Test length analyses in this paper are based on a hard fault set,calculations ofwhich are practicable and simple.Experimental results have been obtained to show the accuracy of thistest length analyser in comparison with that of Savir,Chin and McCluskey,and Wunderlichby using a pseudorandom test generator combined with exhaustive fault simulation.
A new probabilistic testability measure is presented to ease test length analyzes of random testing and pseudorandom testing. Testability measure given in this paper is oriented to signal conflict of reconvergent fanouts.Test length analyzes in this paper are based on a hard fault set, calculations of ishich are practicable and simple. Experimental results have been obtained to show the accuracy of this test length analyzer in comparison with that of Savir, Chin and McCluskey, and Wunderlichby using a pseudorandom test generator combined with exhaustive fault simulation.