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卫星电子器件的单粒子效应研究是目前卫星抗辐射加固研究的重要课题之一。空间高能带电粒子引起的卫星微电子器件逻辑功能翻转或器件损坏事件，包括单粒子翻转事件（ＳＥＵ）、单粒子锁定事件（ＳＥＬ）和单粒子烧毁事件（ＳＥＢ），常常引起卫星故障，甚至造成灾难性的后果。
The study of single-particle effect of satellite electronic devices is one of the most important topics in the study of radiation-hardened satellite. Space-borne high-energy charged particles caused by the satellite microelectronic device logic function flip or device damage events, including single event (SEU), single event (SEL) and single event (SEB), often cause satellite failure, or even cause Disastrous consequences.