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为了用盖革计数器的X射线谱仪测定板状透射试样中的择优取向,讨论了一种采用发散X射线束的方法。指出对一定的试样厚度范围计数率与试样的转动无关,因此不需要校正公式。
In order to determine the preferred orientation in a plate-shaped transmission sample using a Geiger counter X-ray spectrometer, a method employing a divergent X-ray beam is discussed. Pointed out that for a certain sample thickness range count rate has nothing to do with the rotation of the sample, so no correction formula.