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对制作的 Si1-xGex/Si多层异质外延结构进行了研究。并对其做了反射高能电子衍射(RHEED)、X射线衍射(XRD)和扩展电阻(SR)等测量,给出了利用这种结构研制出的异质结双极晶体管(HBT)的输出特性曲线。
The fabricated Si1-xGex / Si multilayer heteroepitaxial structure was studied. The characteristics of RHEED, XRD and SR were measured and the output characteristics of HBT developed by this kind of structure were given. curve.