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This paper presents a method(F method)for determining the optical constants and the thicknesses of semi-transparent thin films.It has the following distinctive features:high precision;rapid determination of themeasured quantities;wide range of convergence of solutions;capable of judging whether or not the results arereasonable.In order to meet the needs of application and engineering design,a family of curves designatedFig.n-F was prepared.Using it n,k,d of the films can be conveniently and accurately determined.From theoptical constants and the thicknesses of the films determined by the F method,all important thermal radiationproperties of the semi-transparent films needed in application can be obtained.
This paper presents a method (F method) for determining the optical constants and the thicknesses of semi-transparent thin films. It has the following distinctive features: high precision; rapid determination of themeasured quantities; wide range of convergence of solutions; capable of judging whether or not the results arereasonable.In order to meet the needs of application and engineering design, a family of curves designated Font .nF was prepared. Using it n, k, d of the films can be conveniently and accurately determined. the thicknesses of the films determined by the F method, all important thermal radiation properties of the semi-transparent films needed in application can be obtained.