论文部分内容阅读
在西安脉冲反应堆上,利用自建的晶体管放大倍数在线测试系统测量了型号为2N2222A的晶体管放大倍数,获得了放大倍数随中子注量的变化曲线。晶体管放大倍数的倒数和中子注量之间有良好的线性关系,利用最小二乘法对该线性关系进行拟合,得到晶体管的中子损伤常数。重点在于对损伤常数不确定度的评定。详细给出了不确定度评定的过程,分析了过程中的各种不确定度来源并对它们逐一进行了计算。不确定度评定的难点在于利用最小二乘法拟合损伤常数过程中如何同时考虑自变量和因变量的不确定度。这个问题在实际问题中很少被碰到。并引入迭代的思想,在现有的数据处理工具基础上简单有效地解决了该问题,避免了复杂运算。
On the Xian pulse reactor, the transistor amplification factor of 2N2222A was measured by self-built on-line transistor amplification system, and the curve of the amplification factor with the neutron flux was obtained. There is a good linear relationship between the inverse of the transistor amplification and the neutron fluence, and the linear relationship is fitted by the least square method to obtain the neutron damage constant of the transistor. The emphasis is on the assessment of the uncertainty of damage constants. The process of assessing the uncertainty is given in detail. The sources of various uncertainties in the process are analyzed and calculated one by one. The difficulty of assessing the uncertainty lies in how to consider the uncertainties of the independent variables and the dependent variables in the process of fitting the damage constant by the least square method. This problem is rarely encountered in practical problems. And the idea of iteration is introduced to solve the problem simply and effectively on the basis of the existing data processing tools, avoiding complicated operations.