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本文应用LAS200型多功能电子能谱仪对硫化亚铜(Cu_xS)-硫化镉(CdS)异质结构的表面和深度剖面进行了分析。AES谱的分析结果表明:在Cu_xS-CdS异质结表面不但吸附有杂质氧和氯,而且有碳元素存在。文中指出了某些杂质元素可能对Cu_xS-CdS电池电性能产生的影响。由AES谱的深度剖面分析和化学分析对比得知,在Cu_xS-CdS结构中Cu_xS层厚度大于700埃,而铜在CdS晶界中局部区域扩散的深度可达几千埃。由于铜在CdS层中的梯度变化和铜在结区扩散的宽度,认为Cu_xS-CdS是一个缓变结,衰降的Cu_xS-CdS太阳电池有较宽的铜扩散区。因此控制铜扩散将会对Cu_xS-CdS电池寿命是有益的。
In this paper, surface and depth profiles of CuSx-CdS heterostructures were analyzed by LAS200 multi-functional electron spectrometer. AES spectrum analysis results show that: in addition to the surface of Cu_xS-CdS heterogeneous impurities adsorbed oxygen and chlorine, but also the presence of carbon. The article pointed out that some of the impurity elements may affect the electrical properties of Cu_xS-CdS cells. According to the analysis of AES spectrum and chemical analysis, the thickness of Cu_xS layer in Cu_xS-CdS structure is more than 700 angstroms, while the depth of diffusion of copper in the grain boundary of CdS can reach several thousand angstroms. Cu_xS-CdS is considered as a slow-change junction due to the gradient of copper in the CdS layer and the width of copper diffusion in the junction region. The decayed Cu_xS-CdS solar cell has a wide copper diffusion region. Controlling copper diffusion will therefore be beneficial to Cu_xS-CdS battery life.