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利用X射线衍射仪 ,分光光度计对Sb Se系和Ge Sb Te系相变光盘记录介质材料非晶态薄膜相变前后结构的变化 ,光学性能进行了系统的研究 ,X射线衍射分析表明 :SbSe非晶态薄膜退火后有Sb的析晶峰 ,SbSe2 有Se的析晶峰 ,符合化学计量比的Sb2 Se3 全部是Sb2 Se3 的共晶峰 .GeSb2 Te4 非晶态薄膜在热退火过仇逐首先形成fcc亚稳相 ,升高退火温度 ,Fcc相转变为稳定的hex相 ,GeSb4 Te4 非晶态薄膜退火后在发生上述变化的同时 ,还有Sb的析晶峰 .分光光度计测试表明 :Sb Se系非晶态的光稳定性很不理想 ,随着波长的改变 ,反射率变化太快 .对于Ge Sb Te系合金 ,在各种波段处 ,两种合金都有较大的反衬度 ,其非晶态的光稳定性也较理想 ,随着波长的改变 ,反射率变化不大
The structure and optical properties of the amorphous films of Sb Se and Ge Sb Te series phase change optical disks were studied systematically by X-ray diffractometer and X-ray diffraction. The results show that SbSe After the amorphous film annealed Sb crystallization peak, SbSe2 Se crystallization peaks, in line with stoichiometric Sb2 Se3 all Sb2 Se3 eutectic peak.GeSb2 Te4 amorphous film in the thermal annealing had hatred by the first The formation of fcc metastable phase, elevated annealing temperature, Fcc phase into a stable hex phase, GeSb4 Te4 amorphous film after annealing in the above changes, but also the crystallization peak of Sb. Spectrophotometer test showed that: Sb The light stability of Se-based amorphous is not ideal, and the reflectance changes too fast with the change of wavelength. For Ge Sb Te-based alloys, both alloys have larger contrast at various wavelength bands, Amorphous light stability is also ideal, as the wavelength changes, the reflectivity changes little