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抗单粒子效应加固是宇航器件研发和卫星电路系统设计面临的重要难题。准确、有效的单粒子效应试验评估对此问题的解决有巨大帮助。中国科学院空间科学与应用研究中心于近十年在国内自主发展了用于单粒子效应评估的脉冲激光试验相关装置、试验技术和方法,对宇航器件和卫星电路开展了初步应用。通过脉冲激光试验,能够快速甄别、定位宇航器件试样的单粒子效应薄弱点,以及快速地摸底评估出芯片的整体加固性能。对于卫星电路系统,脉冲激光试验不仅能够快速摸底评估拟用器件的抗单粒子效应性能,而且能够针对芯片空间分布和电路时序变化进行扫描和定点测试,验证加固效果。
Anti-mononuclear effect reinforcement is an important challenge for space device development and satellite circuit system design. Accurate and effective single-particle test evaluation of this issue has great help. The Center for Space Science and Applied Research, Chinese Academy of Sciences, has independently developed pulsed laser test related devices, test techniques and methods for single-particle effect assessment in China in the recent ten years and has initially applied the aerospace devices and satellite circuits. Through pulsed laser test, we can quickly identify and locate single-particle weak spots of aerospace devices, and quickly and thoroughly evaluate the overall performance of the chip. For satellite circuits, pulsed laser testing not only quickly and thoroughly evaluates the anti-single-particle effect performance of the proposed device, but also verifies the effectiveness of the reinforcement by scanning and pinpointing the chip space distribution and circuit timing changes.