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提出了面向低峰值功耗进行 BIST参数优化的问题 ,给出了相应的种子选取算法 .实验结果表明该方法不需要额外的硬件开销 ,并在保证故障覆盖率的前提下峰值功耗有明显降低
The problem of optimizing BIST parameters for low peak power consumption is proposed and the corresponding seed selection algorithm is given.The experimental results show that this method does not require additional hardware overhead and significantly reduces peak power consumption under the condition of ensuring fault coverage