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介绍了一种基于现场可编程门阵列(FPGA,field programmable gate array)的高性能数模转换器(DAC,digital to analog converter)性能参数的回路测试方法。以FPGA、DAC和模数转换器(ADC,analog to digital converter)等元器件为硬件测试平台,将待测数字信号转换成模拟信号再转换成数字信号,经过Matlab计算和分析后得到DAC芯片的静态特性参数和动态特性参数。其中失调误差为0.036%,增益误差为3.63%,信号噪声比为58 dB,信号噪声及失真比为57.75 dB,无杂散动态范围为62.84 dB,有效位数为9.3。测试结果表明:测试方法通用性好,精确度高,成本低。
A loop test method based on field programmable gate array (DAC) digital high-performance digital-to-analog converter (DAC) performance parameters is introduced. To FPGA, DAC and ADC (ADC, analog to digital converter) and other components for the hardware test platform, the measured digital signal is converted to analog signals and then converted to digital signals, calculated and analyzed by Matlab DAC chip Static and dynamic parameters. The offset error is 0.036%, the gain error is 3.63%, the signal-to-noise ratio is 58 dB, the signal noise and distortion ratio is 57.75 dB, the spurious-free dynamic range is 62.84 dB and the effective number of bits is 9.3. The test results show that the test method has good generality, high accuracy and low cost.