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基本参数法是利用X射线荧光强度的理论公式计算试样各组分浓度的方法。该法的优点是仅需纯元素作标样甚至不用标样即可进行多组分的试样分析。1968年Criss等提出这一方法后,近年来在试样分析、计算经验系数法中的经验系数以及将基本参数法与经验系数法相结合等方面均取得了较大的进展,而日益受到广泛的重视。一些作者认为目前基本参数法准确度尚差,主要是因为基本参数包括原级X射线谱强度分布数据不准确所致,至今已发表的原级X射线谱强度分布数据仅钨靶就有五种之多,其中四
The basic parameter method is the use of X-ray fluorescence intensity of the formula to calculate the concentration of each component of the sample method. The advantage of this method is that only pure elements can be used as standard samples or multicomponent samples can be analyzed without using standard samples. In 1968, Criss and other proposed this method, in recent years, the sample analysis, the empirical coefficient of empirical coefficient method of calculation and the basic parameters of the law and the empirical coefficient method has made great progress, but has been increasingly widespread Pay attention. Some authors believe that the current accuracy of the basic parameter method is still poor, mainly because the basic parameters, including the original primary X-ray intensity distribution data is not accurate due to the published primary X-ray intensity distribution data only tungsten target there are five Many, four of them