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ＺｒＯ２·ＳｉＯ２·Ｐ２Ｏ５半导陶瓷是由ＺｒＯ２、ＳｉＯ２和Ｈ３ＰＯ４用高温固相反应制成．它的傅里叶红外吸收谱是由ＺｒＯ２和ＳｉＯ２的标准谱叠加而成．根据标准峰的位置分别计算出两种氧化物的四个基本声子能量．这些声子按照不同组合方式形成ＺｒＯ２·ＳｉＯ２·Ｐ２Ｏ５半导陶瓷的全部傅里叶红外吸收峰．半导陶瓷的喇曼背向散射峰也是由这些基本声子组合而成．对比四角和单斜ＺｒＯ２的喇曼特征谱线看出，在未掺杂和用Ｙ２Ｏ３或Ｎｂ２Ｏ５掺杂的半导陶瓷样品中，ＺｒＯ２的晶粒微结构分别属于单斜和四角对称晶系．
ZrO2 · SiO2 · P2O5 semi-conductive ceramic is made of ZrO2, SiO2 and H3PO4 by high-temperature solid-state reaction. Its Fourier transform infrared absorption spectrum is composed of the standard spectra of ZrO2 and SiO2. The four basic phonon energies of the two oxides are calculated based on the positions of the standard peaks, respectively. These phonons form all the Fourier transform infrared absorption peaks of ZrO2 · SiO2 · P2O5 semiconductive ceramics according to different combinations. The Raman backscattering peak of the semiconducting ceramic is also composed of these basic phonons. Comparing the Raman spectra of tetragonal and monoclinic ZrO2, it can be seen that the grain microstructures of ZrO2 belong to monoclinic and tetragonal symmetry in undoped and semiconducting ceramics doped with Y2O3 or Nb2O5, respectively.