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在交迭测试体系［１，２］ 的基础上提出了一种利用二选一开关辅助扫描寄存器的排序、能够实现最小测试应用时间的单扫描链的构造方法，给出了单扫描链的构造规则．此外还分析了由于二选一开关的引入带来的硬件开销问题，提出了一个能够减少硬件开销的算法．
Based on the overlap test system [1, 2], this paper proposes a method of constructing a single scan chain that can achieve the minimum test application time by using the rankings of the two alternative switches to assist the scan registers. The structure of the single scan chain is given rule. In addition, it also analyzes the hardware overhead caused by the introduction of a second switch, and proposes an algorithm that can reduce the hardware overhead.