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采用恒电流电化学技术直接在金属钼片上制备了具有白钨矿结构的钼酸盐(BaMoO4)薄膜。对BaMoO4薄膜进行了SEM测试,并对相应的测试结果进行了对比和分析。研究表明,在薄膜生长初期,其生长特性具有若干显著的特点,包括:晶核和晶粒优先选择在基体缺陷处堆砌和生长;生长初期形成的晶核都具有白钨矿结构的骨架;晶核和刚开始长大生成的晶粒都是疏松的;晶粒都明显显示有蜂窝状空隙存在等。在薄膜生长的初始阶段,晶粒基本上以其c轴垂直于薄膜基体表面进行生长;随着薄膜制备时间的延长,晶粒的生长方向倾向于按其c轴在薄膜的表面内的方向进行生长。
The molybdenite (BaMoO4) thin film with scheelite structure was prepared directly on metal molybdenum sheet by galvanostatic galvanostatic technique. The BaMoO4 thin films were SEM-tested and the corresponding test results were compared and analyzed. The results show that there are some remarkable characteristics in the growth of thin films at the initial stage of growth, including: the nuclei and grains are preferentially piled and grown at the matrix defects; the nuclei formed at the initial stage of growth have the scheelite structure; the crystals The nuclei and the grains that are just starting to grow are loose; the grains are clearly showing the presence of honeycomb voids, and so on. At the initial stage of film growth, the crystal grains grow substantially perpendicularly to the surface of the film substrate with their c-axis; as the film preparation time is extended, the crystal growth direction tends to proceed in the direction of the c-axis within the surface of the film Grow.