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本文讨论了IEEE标准1149.1的现状,祝贺标准取得的成功,希望进一步开发边界扫描测试技术,并对各有关公司为实现标准所做的工作进行了评价。 1993和1994年 国际测试会议确认IEEE标准1149.1—1990(标准测试访问口和边界扫描结构)将在电子工业部门得到广泛应用。从最先进的CPU到人造卫星都使用1149.1标准来检测生产中发生的故障,并使功能测试较容易地进行。我们祝贺测试工业界使该标准变为现实,使我们能以有效可行的方法来解决测试问题。
This article discusses the current status of the IEEE standard 1149.1, congratulates on the success of the standard, and hopes to further develop the boundary scan testing technology, and evaluates the work done by various related companies to achieve the standard. In 1993 and 1994, the International Testing Conference confirmed that IEEE Standard 1149.1-1990 (Standard Test Access Port and Boundary Scan Architecture) will be widely used in the electronics industry. From the most advanced CPUs to satellites, the 1149.1 standard is used to detect failures in production and make functional testing easier. We congratulate the testing industry for making this standard a reality and enable us to solve test problems in an effective and feasible way.