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对一个承德紫苏辉石和一个Bamble顽辉石的(100)裂理面进行了X射线光电子能谱(XPS)和俄歇电子谱(AES)深度剖析研究, 并进行了原子力显微镜(AFM)观察. (100)裂理面表面的化学组成与体相有明显差别. 与体相相比, 裂理面表面上Si在金属原子总数中的百分比没有明显变化, Ca和Al是增加的, Mg则减少. 2000 s的AES深度剖析表明, 在近70 nm深度内组成元素的原子百分比随着深度略有起伏, 但平均值水平没有明显变化(承德紫苏辉石中的Si除外);承德紫苏辉石的Al和Si呈互为消长的关系, 这是因为Al-Si是以类质同像替代关系存在的. AFM图像显示(100)裂理面上有成层状生长的多边形形态的丘状生长物, 厚度可在零至几百nm, 它们是在裂理面上次生生长的层状硅酸盐矿物. 上述现象的观测和基本规律对认识风化作用和水岩反应的机理具有意义.
X-ray photoelectron spectroscopy (XPS) and Auger electron spectroscopy (AES) depth profiling were performed on a Chengde peroid pyroxene and a (100) cleaved Biffhire pyretic surface. Atomic force microscopy (AFM) (100) The chemical composition of the cleaved surface is significantly different from that of the bulk. Compared with the bulk phase, the percentage of Si in the total number of metal atoms on the surface of the cleaved surface does not change significantly, Ca and Al increase, while Mg The 2000 s AES depth analysis showed that the atomic percentage of the constituent elements fluctuated slightly with depth within the depth of nearly 70 nm, but the average level did not change significantly (except Si in Chengde periclase); Chengde perilla The pyroxene Al and Si show a declining relationship with each other, because Al-Si exists in the phenomenon of isosubical substitution. AFM images show that the (100) polygonal mound with layered growth on the fissured surface Shaped growth, with thickness ranging from zero to several hundred nm, which are layered silicate minerals that grow secondary on the cleavage plane.The observation and basic rules of the above phenomena are significant to understand the mechanism of weathering and water-rock reaction .