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本文介绍了 MC6800功能测试程序的一种研制方案及程序的编制。该方案立足于测试技术的先进性,测试程序的有效性、实用性与经济性。以生产厂和用户之间交接产品时共同遵守的测试为宗旨,并对各类不同用户的使用环境提供方便。该方案吸收了一些现有方法的长处,并有所改进。根据我国微处理机生产与测试的国情,提出一种称为功能与结构兼测法的测试方法(这种方法的详细论证见参考文献[1]、[2]、[3])。这种方法在对微处理机进行功能测试的过程中,加强对弱点(容易出故障的工作部位)的测试。考虑微处理机工作时的内部干扰,信号丢失,传输延时,时钟链、进位链、时钟负载、频率范围(尤其是高低端的情况)、逻辑传送、驱动能力等因素。文章简要介绍了功能与结构兼测法的思想及其实现。对测试程序的结构进行了分析与说明。
This article describes a MC6800 functional test program of a program and program development. The program based on the advanced testing technology, test the effectiveness of the program, practicality and economy. In the production plant and the transfer of products between users to comply with the test for the purpose of testing, and for all types of users to provide convenient environment. The program has benefited from some of the existing methods and has improved. According to the national conditions of microprocessor production and testing in our country, a test method called function and structure and test method is proposed (see [1], [2], [3] for details of this method). This method enhances the testing of weak points (easy-to-fail work areas) during functional testing of microprocessors. Consider microprocessor internal interference, signal loss, transmission delay, the clock chain, carry chain, the clock load, the frequency range (especially high and low end of the case), logic transfer, drive capacity and other factors. The article briefly introduces the function and structure of both thinking and its realization. The structure of the test program is analyzed and explained.