论文部分内容阅读
对于在轨微小卫星而言,单粒子闩锁(Single Event Latchup,SEL)是最具破坏性的单粒子效应之一,其后果轻则损坏器件,重则使在轨卫星失效。首先介绍了SEL发生机理,分析并总结现有抗SEL的关键技术。其次提出了空间单粒子闩锁防护措施并设计了一种可恢复式抗SEL电源接口电路,实现对卫星星上设备的防闩锁及过流保护。最后利用脉冲激光模拟单粒子效应技术对具有飞行经验的芯片进行实验测试。实验结果表明,该电路能够准确地检测SEL的发生,有效解除SEL效应,保证系统运行稳定可靠。
For on-orbit microsatellites, Single Event Latchup (SEL) is one of the most destructive single-particle effects, with minor consequences of damage to the device and failure of on-orbit satellites. Firstly, the mechanism of SEL was introduced, the key technologies of anti-SEL were analyzed and summarized. Secondly, a space single-particle latch protection measure is proposed and a recoverable anti-SEL power interface circuit is designed to prevent latch-up and over-current protection of the satellite satellite equipment. Finally, pulse laser simulation of single-particle effect technology is used to experimentally test the chip with flight experience. The experimental results show that the circuit can detect the occurrence of SEL accurately, relieve the SEL effect effectively and ensure the stable and reliable operation of the system.