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为了解决高纯钽及其氧化物中杂质元素的测定问题 ,采用ICP AES测定方法 ,对测定中基体效应及光谱干扰进行了研究 ,讨论了分离速率、洗脱液量及其浓度等因素对基体分离效果和杂质元素回收率的影响 ,建立了简便、快速、准确测定高纯钽及其氧化物中杂质元素的新方法 .研究结果表明 :用该法测定高纯Ta2 O5 中 1 2种杂质元素回收率在 90 %～ 1 1 0 %之间 ,相对标准偏差小于 8 1 5 % .其准确度及精密度均较好 ,可以适用于日常配合分析以及出口产品的控制分析
In order to solve the problem of determination of impurity elements in high-purity tantalum and its oxides, the ICP-AES method was used to study the matrix effect and spectral interference in the determination. The effects of separation rate, amount of eluent and its concentration on the matrix Separation effect and recovery of impurity elements, a new method for the simple, rapid and accurate determination of impurity elements in high-purity tantalum and its oxides was established.The results show that the determination of 12 impurity elements in high purity Ta 2 O 5 The recoveries ranged from 90% to 110%, and the relative standard deviations were less than 81.5% .Their accuracy and precision were good, which could be applied to daily coordination analysis and control analysis of export products