根据半导体光学常数间的关系,通过测量Hg_(1-x)Cd_xTe晶片不同厚度时的透射比,求得了Hg_(1-x)Cd_xTe的光学常数。本文采用迭代法精确求解有关方程组,避免了计算过程引入的误差,提高了测量结果的精度。这种方法也适用于其他半导体光学常数的测量。 According to the relationship between semiconductor optical constants, the optical constants of Hg_ (1-x) Cd_xTe were obtained by measuring the transmittance at different thicknesses of Hg_ (1-x) Cd_xTe wafers. In this paper, the iterative method is used to solve the equations accurately, which avoids the errors introduced by the calculation process and improves the accuracy of the measurement results. This method is also suitable for the measurement of other semiconductor optical constants.