X射线荧光分析中最基本的测量是X荧光辐射的强度。在元素分析线角度处测得的强度并不都是样品中该元素的贡献,除元素分析线的强度(净强度)之外的计数统称为背景。 在痕量分析中,背景在分析线强度中占有很大比例。尤其是在检出限附近,背景强度接近于分析线强度。这时背景的测量、校正和扣除等,就成为影响分析结果的重要因 The most basic measurement in X-ray fluorescence analysis is the intensity of X-ray fluorescence. The intensity measured at the angle of the elemental analysis is not always the contribution of that element in the sample. The counts other than the intensity (net strength) of the elemental analysis line are collectively referred to as the background. In trace analysis, the background accounts for a large proportion of the line intensity. Especially near the detection limit, the background intensity is close to the analysis line intensity. At this time the background measurement, correction and deduction, etc., has become an important factor affecting the analysis results