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用Ｘ衍射线形分析法测定了Ｆｅ－３０．３％Ｍｎ－６．１％Ｓｉ（质量分数）形状记忆合金经不同温度淬火和经退火后的层错几率Ｐｓｆ．研究了淬火空位、层错几率与马氏体相变点Ｍｓ的关系．结果表明，增加淬火空位将促进层错的形成，使Ｍｓ提高；且Ｍｓ与１／Ｐｓｆ呈线性关系．对可能的机理进行了讨论．
The stacking fault probability Psf of Fe-30.3% Mn-6.1% Si (mass fraction) shape memory alloy quenched at different temperatures and annealed was determined by X-ray diffraction analysis. The relations between quenching vacancy, stacking fault probability and martensite transformation point Ms were studied. The results show that the increase of quenching vacancies will promote the formation of layer faults and increase Ms, and Ms has a linear relationship with 1 / Psf. Possible mechanisms are discussed.