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利用SGI40-125AAA型程控直流电源、PCI-GPIB卡、电压表、功率计表以及光谱仪等建立高功率半导体激光器测试系统,并在LabVIEW环境下开发了测试软件,通过软件控制直流电源、功率计表等仪器的触发输出、触发输入实现测试设备的同步工作,在保证测试准确性的同时,实现了快速(每个测试点的工作时间约300 ms)的扫描测试,在测试速度上比多个仪器单独测试有了明显提高。可以实现千瓦级连续工作半导体激光器的光功率P、电压V、电光转换效率η、阈值电流、光谱等参数的扫描测试。建立的测试系统准确度高,扫描速度快,测试软件界面操作方便,显示结果直观、全面。
Using SGI40-125AAA program-controlled DC power supply, PCI-GPIB card, voltmeter, power meter and spectrometer to establish high-power semiconductor laser test system and test software developed in LabVIEW environment, the software controls the DC power supply, power meter Such as the trigger output of the instrument, the trigger input to achieve the synchronization of test equipment, to ensure the accuracy of the test at the same time, to achieve fast (each test point of about 300 ms working time) scan test at a test speed than multiple instruments Individual test has been significantly improved. Can realize the scanning test of optical power P, voltage V, electro-optical conversion efficiency η, threshold current, spectrum and other parameters of a kilowatt-class continuous working semiconductor laser. The established test system has the advantages of high accuracy, fast scanning speed, convenient operation of the test software interface and intuitive and comprehensive display of results.