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检测CMOS电路中的开路故障通常需要使用测试向量对。内建自测试(BIST)作为一种有效的测试技术可以大大降低测试开销。本文采用一种具有规则性、模块化和层叠结构的自动控制单元(CA),来构造产生测试向量对的 BIST模块。实验证明,该方法用于瞬态电流测试是有效的。
Testing open circuits in CMOS circuits usually requires the use of test vector pairs. Built-in self-test (BIST) as an effective test technology can greatly reduce the test overhead. In this paper, an automatic control unit (CA) with a regular, modular and cascaded structure is used to construct a BIST module that generates test vector pairs. Experiments show that this method is effective for transient current test.