ＦＰ标准具和干涉仪利用多光束干涉的原理，产生极锐的干涉条纹并且谐振频率对ＦＰ腔长的变化非常敏感，根据这些特点，从利用ＦＰ干涉仪进行激光器的频率锁定、稳频，光学倍程精密定位和纳米测量三个角度综述了在长度测量领域ＦＰ干涉仪的发展情况；在分析主要存在的问题和解决方法的基础上，讨论了ＦＰ干涉仪的发展方向，并指出在纳米测量中ＦＰ干涉仪将起到越来越重要的作用。 F  P etalon and interferometer using the principle of multi-beam interference to produce extremely sharp interference fringes and resonant frequency of PP cavity length is very sensitive to changes in these characteristics, from the use of FP interferometer laser frequency This paper summarizes the development of FP interferometer in the field of length measurement from three perspectives, namely, locking, frequency stabilization, optical double-precision positioning and nanometer measurement. Based on the analysis of the main problems and solutions, the FP interference Instrument development direction, and pointed out that in the measurement of F-P interferometer will play an increasingly important role.