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采用X射线小角散射法(SAXS)和光子相关谱法(PCS)测试了纳米钨(W)粉的粒度分布。结果表明,采用SAXS测试出的纳米W粉的粒度分布与透射电镜观察和比表面积法测试结果十分接近,能较为准确地表征纳米W粉的一次颗粒的粒度分布;但为了得到可信的结果,所选择的X射线衍射仪的最小可测试角必须足够小。PCS法测试的纳米W粉的粒度随分散条件的变化而变化,所提供的最佳分散条件可用于测定二次颗粒的粒度分布。
The particle size distribution of nanometer tungsten (W) powder was tested by X-ray small angle scattering (SAXS) and photon correlation spectroscopy (PCS). The results show that the particle size distribution of nano-W powder tested by SAXS is very close to that of transmission electron microscopy and surface area method. It can characterize the particle size distribution of nano-W powder more accurately. However, in order to obtain credible results, The minimum testable angle of the selected X-ray diffractometer must be small enough. The particle size of nano-W powder tested by the PCS method varies with the dispersion conditions, and the optimal dispersion conditions provided can be used to determine the particle size distribution of the secondary particles.