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IEEE1149.1边界扫描机制是一种新型的VLSI电路测试及可测性设计方法,在边界扫描测试过程中,生成合理的测试向量集是有效应用边界扫描机制对电路系统进行测试的关键。在分析传统边界扫描测试生成算法和W步、C步自适应测试生成算法的基础上,提出了一种改进的自适应测试生成算法。实验表明该算法具有完备的诊断能力和紧凑性指标较低的优点,是一种性能优良的完备测试生成算法。
IEEE1149.1 boundary scan mechanism is a new VLSI circuit test and design method of testability. During the boundary scan test, generating a reasonable set of test vectors is the key to the effective application of the boundary scan mechanism to test the circuit system. Based on the analysis of traditional boundary scan test generation algorithm and W step and C step adaptive test generation algorithm, an improved adaptive test generation algorithm is proposed. Experiments show that the algorithm has the advantages of complete diagnosis ability and low compactness index, and is a perfect test generation algorithm with excellent performance.