论文部分内容阅读
应用蒸发镀膜方法,分别在室温和液氮温度(77K)玻璃基底上制备了银薄膜样品。对两种样品的微观结构和光学性质进行了对比研究,微观结构应用X射线衍射仪、扫描电子显微镜进行分析,光学性质应用椭圆偏振光谱仪进行研究,测量的光学参数与理论计算的结果基本吻合。比较液氮温度基底上制备的银薄膜与室温基底上制备的银薄膜表面后发现:前种薄膜的表面更均匀、颗粒更小;两种薄膜的光频介电函数实部ε1基本没有差别,前种薄膜的光频介电函数虚部ε2大;前种薄膜的光学吸收增强,吸收峰发生蓝移和宽化。实验结果表明颗粒膜的光学吸收峰的位置依赖于颗粒膜中金属的介电常数和粒子尺寸。
The silver thin film samples were prepared on the glass substrate at room temperature and liquid nitrogen temperature (77K) by evaporation method. The microstructure and optical properties of the two samples were compared. The microstructure was analyzed by X-ray diffraction and scanning electron microscopy. The optical properties were analyzed by ellipsometer. The measured optical parameters were in good agreement with the theoretical calculation. Comparing the silver thin film prepared on the liquid nitrogen temperature substrate and the silver thin film surface prepared on the room temperature substrate, the former film is more uniform in surface and smaller in particle size; the real part ε1 of the dielectric constant of the two films is almost the same, The former kind of film has a large imaginary part ε2 of the dielectric constant of the optical frequency; the optical absorption of the former kind of film is enhanced, and the absorption peak is blue shifted and broadened. The experimental results show that the location of the optical absorption peak of the particle film depends on the dielectric constant and the particle size of the metal in the particle film.