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This paper reports that a series of silver oxide (Ag x O) films are deposited on glass substrates by direct-current reactive magnetron sputtering at a substrate temperature of 250 C and an oxygen flux ratio of 15:18 by modifying the sputtering power (SP).The Ag x O films deposited apparently show a structural evolution from cubic biphased (AgO + Ag 2 O) to cubic single-phased (Ag 2 O),and to biphased (Ag 2 O + AgO) structure.Notably,the cubic single-phased Ag 2 O film is deposited at the SP=105 W and an AgO phase with 220 orientation discerned in the Ag x O films deposited using the SP > 105 W.The transmissivity and reflectivity of the Ag x O films in transparent region decrease with the increase the SP,whereas the absorptivity inversely increases with the increase of the SP.These results may be due to the structural evolution and the increasing film thickness.A redshift of the films’ absorption edges determined in terms of Tauc formula clearly occurs from 3.1 eV to 2.73 eV with the increase of the SP.
This paper reports that a series of silver oxide (Ag x O) films are deposited on glass substrates by direct-current reactive magnetron sputtering at a substrate temperature of 250 C and an oxygen flux ratio of 15:18 by modifying the sputtering power (SP ). The Ag x O films deposited apparently show a structural evolution from cubic biphased (AgO + Ag 2 O) to cubic single-phased (Ag 2 O), and to biphased (Ag 2 O + AgO) structures. Notably, the cubic single-phased Ag 2 O film is deposited at the SP = 105 W and an AgO phase with 220 orientation discerned in the Ag x O films deposited using the SP> 105 W. The transmissivity and reflectivity of the Ag x O films in the transparent region decrease with the increase in the SP increase, the increase in the SP increase, the increase in the increase in the SP, the increase in the SP of the structural strain and the increasing film thickness. A redshift of the films’ absorbed edges determined in terms of Tauc formula from 3.1 eV to 2.73 eV with the in crease of the SP.