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电光相位调制器是光纤通信系统、微波光子系统和相干光通信系统中的关键器件之一.作为器件本征参数,电光相位调制器的半波电压通常利用光谱方法和电谱方法进行测量.光谱方法受到光源线宽和光谱仪分辨率限制,测量的分辨率较低;电谱方法则需要光电检测之前将相位调制转换成强度调制,电谱方法的主要困难在于需要对探测器的不平坦响应进行额外校准.提出了利用双音外差实现电光相位调制器半波电压自校准测量新方法,该方法利用双音电光相位调制的边带与移频光载波的外差拍频,对外差拍频信号进行频谱分析,获得电光相位调制器的半波电压;通过设定双音调制信号的频率关系,克服了探测器光电转换中的不平坦频率响应,实现了自校准测量.该方法可扩展探测器和频谱仪的测试频率两倍以上,节省至少一半的带宽需求.与光谱测量方法相比,该方法测试分辨率大幅提高且避免了光源线宽的影响;与传统电域测量方法相比,该方法无需额外校准,无驱动功率和工作波长限制,且对测试仪器带宽需求降低一半以上.实验证实了所提方法获得的电光相位调制器半波电压的测量结果与光谱分析法获得的结果一致,且大幅度地提高了测量范围和分辨率.该方法提供了非常简单的电光相位调制器微波特性化分析方法,对其他光电子器件分析也提供了参考.
Electro-optic phase modulator is one of the key devices in optical fiber communication system, microwave photonic system and coherent optical communication system.As the intrinsic parameter of the device, the half-wave voltage of electro-optic phase modulator is usually measured by the spectroscopic method and the spectroscopic method. The method is limited by the line width of the light source and the resolution of the spectrometer, and the resolution of the measurement is low. The spectroscopic method needs to convert the phase modulation to the intensity modulation before the photoelectric detection. The main difficulty of the spectrum method lies in that the unsmooth detector response needs to be performed Extra calibration. A new method of half-wave voltage self-calibration measurement of electro-optic phase modulator using dual-tone heterodyne is proposed. This method uses the heterodyne beat frequency of the two-tone electro-optical phase modulation sideband and frequency shifted optical carrier, Signal to obtain the half-wave voltage of the electro-optical phase modulator, and overcomes the uneven frequency response in the photoelectric conversion of the detector by setting the frequency relationship of the dual-tone modulated signal, and realizes the self-calibration measurement. This method can extend the detection And spectrum analyzer test more than twice the frequency, saving at least half the bandwidth requirements.Compared with the spectral measurement method, the method of measuring The resolution is greatly improved and the influence of the light source line width is avoided. Compared with the traditional electric domain measurement method, the method requires no additional calibration, no driving power and working wavelength limitation, and reduces the bandwidth requirement of the test instrument by more than half. The measurement results of the half-wave voltage of the electro-optic phase modulator obtained by the method are in good agreement with those obtained by the spectral analysis method, and greatly improve the measurement range and resolution. The method provides a very simple analysis of the electro-optic phase modulator microwave characterization Method, also provides reference for other optoelectronic devices analysis.