参数漂移模型描述了元件参数从额定值发生偏移的行为。随着可靠性朝无故障寿命或无需维修工作周期的方向发展 ,对产品的参数漂移进行研究越来越显重要。利用 MΦ Itoft统计模型描述了电子元件的参数漂移行为 ,通过元件的早期寿命测试来预测元件寿命 ,并给出了应用实例 The parameter drift model describes the behavior of component parameters offset from the nominal value. As reliability progresses toward either trouble-free life or maintenance-free work cycles, it becomes increasingly important to study the parameter drift of the product. The MΦ Itoft statistical model is used to describe the parameter drift behavior of electronic components. The life expectancy of the components is predicted by the early life test of the components. The application examples